Simulation of specimen-induced aberrations for objects with spherical and cylindrical symmetry.

Wavefront aberrations caused by the refractive index structure of the specimen are known to compromise signal intensity and three-dimensional resolution in confocal and multiphoton microscopy. However, adaptive optics can measure and correct specimen-induced aberrations. For the design of an adaptiv...

Повний опис

Бібліографічні деталі
Автори: Schwertner, M, Booth, M, Wilson, T
Формат: Journal article
Мова:English
Опубліковано: 2004