X-ray diffraction topography : methods and applications
<p>This thesis describes the application of the well established technique of X-ray diffraction topography to a variety of problems, and includes considerations of the optimum conditions for taking rapid topographs.</p> <p>Chapter I contains a brief review of the subject together...
| Những tác giả chính: | , |
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| Tác giả khác: | |
| Định dạng: | Luận văn |
| Ngôn ngữ: | English |
| Được phát hành: |
1971
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