X-ray diffraction topography : methods and applications

<p>This thesis describes the application of the well established technique of X-ray diffraction topography to a variety of problems, and includes considerations of the optimum conditions for taking rapid topographs.</p> <p>Chapter I contains a brief review of the subject together...

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Detaylı Bibliyografya
Asıl Yazarlar: Tanner, B, Tanner, B. K.
Diğer Yazarlar: Humphreys, C
Materyal Türü: Tez
Dil:English
Baskı/Yayın Bilgisi: 1971