Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
We demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector...
| Հիմնական հեղինակներ: | , , , , |
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| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
AIP Publishing
2023
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