Allen, C., Danaie, M., Warner, J., Batey, D., & Kirkland, A. (2023). Super-resolution electron ptychography of low dimensional materials at 30 keV: Beyond the detector limit. AIP Publishing.
Citace podle Chicago (17th ed.)Allen, CS, M. Danaie, JH Warner, DJ Batey, a AI Kirkland. Super-resolution Electron Ptychography of Low Dimensional Materials at 30 KeV: Beyond the Detector Limit. AIP Publishing, 2023.
Citace podle MLA (9th ed.)Allen, CS, et al. Super-resolution Electron Ptychography of Low Dimensional Materials at 30 KeV: Beyond the Detector Limit. AIP Publishing, 2023.
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