Allen, C., Danaie, M., Warner, J., Batey, D., & Kirkland, A. (2023). Super-resolution electron ptychography of low dimensional materials at 30 keV: Beyond the detector limit. AIP Publishing.
芝加哥风格引文Allen, CS, M. Danaie, JH Warner, DJ Batey, 与 AI Kirkland. Super-resolution Electron Ptychography of Low Dimensional Materials at 30 KeV: Beyond the Detector Limit. AIP Publishing, 2023.
MLA引文Allen, CS, et al. Super-resolution Electron Ptychography of Low Dimensional Materials at 30 KeV: Beyond the Detector Limit. AIP Publishing, 2023.
警告：这些引文格式不一定是100％准确.