Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
We demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector...
Main Authors: | , , , , |
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Formato: | Journal article |
Idioma: | English |
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AIP Publishing
2023
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_version_ | 1826310463829311488 |
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author | Allen, CS Danaie, M Warner, JH Batey, DJ Kirkland, AI |
author_facet | Allen, CS Danaie, M Warner, JH Batey, DJ Kirkland, AI |
author_sort | Allen, CS |
collection | OXFORD |
description | We demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector to be inserted which partially shadows a lower pixelated detector to simultaneously record a conventional annular dark field image and a ptychographic dataset. We apply this approach to 30 keV imaging of monolayer molybdenum disulfide and achieve an Abbe limited resolution of 1.2 ± 0.1Å in our reconstructions. |
first_indexed | 2024-03-07T07:51:25Z |
format | Journal article |
id | oxford-uuid:fb2aadb7-8a50-40e1-9998-d9a22cb68f9b |
institution | University of Oxford |
language | English |
last_indexed | 2024-03-07T07:51:25Z |
publishDate | 2023 |
publisher | AIP Publishing |
record_format | dspace |
spelling | oxford-uuid:fb2aadb7-8a50-40e1-9998-d9a22cb68f9b2023-07-17T09:11:48ZSuper-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limitJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:fb2aadb7-8a50-40e1-9998-d9a22cb68f9bEnglishSymplectic ElementsAIP Publishing2023Allen, CSDanaie, MWarner, JHBatey, DJKirkland, AIWe demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector to be inserted which partially shadows a lower pixelated detector to simultaneously record a conventional annular dark field image and a ptychographic dataset. We apply this approach to 30 keV imaging of monolayer molybdenum disulfide and achieve an Abbe limited resolution of 1.2 ± 0.1Å in our reconstructions. |
spellingShingle | Allen, CS Danaie, M Warner, JH Batey, DJ Kirkland, AI Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit |
title | Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit |
title_full | Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit |
title_fullStr | Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit |
title_full_unstemmed | Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit |
title_short | Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit |
title_sort | super resolution electron ptychography of low dimensional materials at 30 kev beyond the detector limit |
work_keys_str_mv | AT allencs superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit AT danaiem superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit AT warnerjh superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit AT bateydj superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit AT kirklandai superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit |