Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit

We demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector...

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Main Authors: Allen, CS, Danaie, M, Warner, JH, Batey, DJ, Kirkland, AI
Formato: Journal article
Idioma:English
Publicado em: AIP Publishing 2023
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author Allen, CS
Danaie, M
Warner, JH
Batey, DJ
Kirkland, AI
author_facet Allen, CS
Danaie, M
Warner, JH
Batey, DJ
Kirkland, AI
author_sort Allen, CS
collection OXFORD
description We demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector to be inserted which partially shadows a lower pixelated detector to simultaneously record a conventional annular dark field image and a ptychographic dataset. We apply this approach to 30 keV imaging of monolayer molybdenum disulfide and achieve an Abbe limited resolution of 1.2 ± 0.1Å in our reconstructions.
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spelling oxford-uuid:fb2aadb7-8a50-40e1-9998-d9a22cb68f9b2023-07-17T09:11:48ZSuper-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limitJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:fb2aadb7-8a50-40e1-9998-d9a22cb68f9bEnglishSymplectic ElementsAIP Publishing2023Allen, CSDanaie, MWarner, JHBatey, DJKirkland, AIWe demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector to be inserted which partially shadows a lower pixelated detector to simultaneously record a conventional annular dark field image and a ptychographic dataset. We apply this approach to 30 keV imaging of monolayer molybdenum disulfide and achieve an Abbe limited resolution of 1.2 ± 0.1Å in our reconstructions.
spellingShingle Allen, CS
Danaie, M
Warner, JH
Batey, DJ
Kirkland, AI
Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
title Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
title_full Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
title_fullStr Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
title_full_unstemmed Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
title_short Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
title_sort super resolution electron ptychography of low dimensional materials at 30 kev beyond the detector limit
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AT danaiem superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit
AT warnerjh superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit
AT bateydj superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit
AT kirklandai superresolutionelectronptychographyoflowdimensionalmaterialsat30kevbeyondthedetectorlimit