Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit

We demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector...

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Bibliografske podrobnosti
Main Authors: Allen, CS, Danaie, M, Warner, JH, Batey, DJ, Kirkland, AI
Format: Journal article
Jezik:English
Izdano: AIP Publishing 2023