Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
Recent advances using cross-correlation analysis of full resolution high quality electron backscatter diffraction (EBSD) patterns have provided a method for quantitatively mapping the stored dislocation density at high spatial resolution. Larger areas could be mapped with image binning or coarser st...
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2013
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