Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
Fatigue of copper single crystals, oriented for single slip, has been studied using electron channelling contrast imaging (ECCI) in a scanning electron microscope. This technique was used to detect and characterize dislocation structures in bulk specimens. With the incident beam set at the Bragg con...
Main Authors: | , , |
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Format: | Journal article |
Language: | English |
Published: |
1997
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