High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
Electron backscatter diffraction (EBSD) is a widely available and relatively easy-to-use scanning-electron-microscopy-based diffraction technique. Recently, Wilkinson, Meaden, and Dingley presented two papers on a new cross-correlation-based analysis of EBSD patterns which allow variations in the el...
| Main Authors: | , , , , |
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
2010
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