High-resolution electron backscatter diffraction: an emerging tool for studying local deformation

Electron backscatter diffraction (EBSD) is a widely available and relatively easy-to-use scanning-electron-microscopy-based diffraction technique. Recently, Wilkinson, Meaden, and Dingley presented two papers on a new cross-correlation-based analysis of EBSD patterns which allow variations in the el...

Disgrifiad llawn

Manylion Llyfryddiaeth
Prif Awduron: Wilkinson, A, Clarke, E, Britton, T, Littlewood, P, Karamched, P
Fformat: Journal article
Iaith:English
Cyhoeddwyd: 2010