Improvements in the mass resolution of the three-dimensional atom probe

Improvements in the mass resolution of the three-dimensional atom probe

A new three-dimensional atom probe has been developed, in which energy compensation has been included in order to improve the mass resolution of the technique. A first order reflectron is used as its energy compensating device. The incorporation of a reflectron in a three-dimensional atom probe is l...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	Sijbrandij, S, Cerezo, A, Godfrey, T, Smith, G
Формат:	Conference item
Хэвлэсэн:	1996

Ижил төстэй зүйлс

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Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
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RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
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THE EFFECT OF LASER-PULSE SHAPE ON MASS RESOLUTION IN THE PULSED-LASER ATOM PROBE
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Three-dimensional atom probe studies of metallic multilayers
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Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
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Numerical modelling of mass resolution in a scanning atom probe.
-н: Cerezo, A, зэрэг
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Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
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Studies of boundaries and interfaces on the atomic scale by atom probe FIM
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Three-dimensional atom probe characterization of alloy element partitioning in cementite during tempering of alloy steel.
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Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
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VISUALIZATION AND ANALYSIS OF 3-DIMENSIONAL ATOM PROBE DATA
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Aspects of the observation of clusters in the 3-dimensional atom probe
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Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe.
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THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
-н: Cerezo, A, зэрэг
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Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
-н: Gault, B, зэрэг
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QUANTITATIVE ATOM PROBE ANALYSIS OF SPINODAL REACTION IN FERRITE PHASE OF DUPLEX STAINLESS-STEEL
-н: Brown, J, зэрэг
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Three-dimensional atomic scale analysis of interfaces
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MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
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