Materials advances through aberration-corrected electron microscopy
Over the last few years, the performance of electron microscopes has undergone a dramatic improvement, with achievable resolution having more than doubled. It is now possible to probe individual atomic sites in many materials and to determine atomic and electronic structure with single-atom sensitiv...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2006
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