Phase reconstruction using fast binary 4D STEM data
We report the application of focused probe ptychography using binary 4D datasets obtained using scanning transmission electron microscopy (STEM). Modern fast pixelated detectors have enabled imaging of individual convergent beam electron diffraction patterns in a STEM raster scan at frame rates in t...
| Main Authors: | , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
AIP Publishing
2020
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