Phase reconstruction using fast binary 4D STEM data

Phase reconstruction using fast binary 4D STEM data

We report the application of focused probe ptychography using binary 4D datasets obtained using scanning transmission electron microscopy (STEM). Modern fast pixelated detectors have enabled imaging of individual convergent beam electron diffraction patterns in a STEM raster scan at frame rates in t...

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Bibliographic Details
Main Authors:	O'Leary, CM, Allen, CS, Huang, C, Kim, JS, Liberti, E, Nellist, PD, Kirkland, AI
Format:	Journal article
Language:	English
Published:	AIP Publishing 2020

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