Optimal tilt magnitude determination for aberration-corrected super resolution exit wave function reconstruction.
Transmission electron microscope (TEM) images recorded under tilted illumination conditions transfer higher spatial frequencies than axial images. This super resolution information transfer is highly directional in a single image, but can be extended in all directions through the use of complementar...
主要な著者: | Haigh, S, Sawada, H, Kirkland, A |
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フォーマット: | Journal article |
言語: | English |
出版事項: |
2009
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