Quantum metrology with imperfect states and detectors
Quantum enhancements of precision in metrology can be compromised by system imperfections. These may be mitigated by appropriate optimization of the input state to render it robust, at the expense of making the state difficult to prepare. In this paper, we identify the major sources of imperfection...
| 主要な著者: | , , , , , |
|---|---|
| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
2011
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