High-pressure x-ray scattering and computer simulation studies of density-induced polyamorphism in silicon

A low- to high-density pressure-driven phase transition in amorphous silicon is investigated by synchrotron x-ray diffraction in the diamond anvil cell. Complementary atomistic molecular dynamics computer simulations provide insight into the underlying structural transformations and allow us to inte...

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Bibliographic Details
Main Authors: Daisenberger, D, Wilson, M, McMillan, P, Quesada Cabrera, R, Wilding, M, Machon, D
Format: Journal article
Language:English
Published: 2007