Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

The development of new nanocrystals with outstanding physico-chemical properties requires a full three-dimensional (3D) characterization at the atomic scale. For homogeneous nanocrystals, counting the number of atoms in each atomic column from high angle annular dark field (HAADF) scanning transmiss...

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Những tác giả chính:	van den Bos, K, De Backer, A, Martinez, G, Winckelmans, N, Bals, S, Nellist, P, Van Aert, S
Định dạng:	Journal article
Ngôn ngữ:	English
Được phát hành:	American Physical Society 2016

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