Surface morphology of In0.5Ga0.5 quantum dots grown using stranski-krastanov growth mode
In this research an atomic force microscopy (AFM) study on self-assembled In0.5Ga0.5As/GaAs quantum dots (QDs) was performed. Surface morphology of self-assembled In0.5Ga0.5As QDs changes with different growth time. Increasing growth time increased the dots size and decreased the dots density. In ad...
| Päätekijät: | , , , |
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| Aineistotyyppi: | Artikkeli |
| Kieli: | English |
| Julkaistu: |
Universiti Kebangsaan Malaysia
2010
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| Linkit: | http://journalarticle.ukm.my/7448/1/26_Ayiesah.pdf |