Investigation of optical and structural properties of ion-assisted deposition (IAD) ZrO2 thin films

Zirconium dioxide thin films were deposited onto fused silica glass substrates by electron-beam assisted by oxygen ions using high vacuum coater equipped with electron beam gun at ambient substrate temperature. The properties of the films have been investigated using X-ray diffraction (XRD), X-ray p...

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Bibliographic Details
Main Authors: Farhan, M.S., Zalnezhad, E., Bushroa, A.R.
Format: Article
Published: Springer Verlag (Germany) 2013
Subjects: