Effect of damage on the etching and X-ray diffraction properties of zircon

The etching time of zircons with different amounts of radiation damage is measured. It is found that as track density increases, a shorter etching time is needed to reveal the tracks. The change in X-ray diffraction angle (20) of the (112) plane for zircon with different amounts of radiation damage...

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Bibliographic Details
Main Author: Amin, Y.M.
Format: Article
Published: Elsevier 1988
Subjects: