Effect of damage on the etching and X-ray diffraction properties of zircon

The etching time of zircons with different amounts of radiation damage is measured. It is found that as track density increases, a shorter etching time is needed to reveal the tracks. The change in X-ray diffraction angle (20) of the (112) plane for zircon with different amounts of radiation damage...

ver descrição completa

Detalhes bibliográficos
Autor principal: Amin, Y.M.
Formato: Artigo
Publicado em: Elsevier 1988
Assuntos: