Effect of damage on the etching and X-ray diffraction properties of zircon
The etching time of zircons with different amounts of radiation damage is measured. It is found that as track density increases, a shorter etching time is needed to reveal the tracks. The change in X-ray diffraction angle (20) of the (112) plane for zircon with different amounts of radiation damage...
Autor principal: | |
---|---|
Formato: | Artigo |
Publicado em: |
Elsevier
1988
|
Assuntos: |