Effect of damage on the etching and X-ray diffraction properties of zircon
The etching time of zircons with different amounts of radiation damage is measured. It is found that as track density increases, a shorter etching time is needed to reveal the tracks. The change in X-ray diffraction angle (20) of the (112) plane for zircon with different amounts of radiation damage...
Main Author: | Amin, Y.M. |
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Format: | Article |
Published: |
Elsevier
1988
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Subjects: |
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