Electrical Characteristics of Oxidized/Nitrided Zr Thin Film on Si
In this work, electrical properties of simultaneously oxidized and nitrided sputtered Zr thin film on n-type Si via N2O gas were systematically investigated and charge conduction mechanisms through the oxide were quantitatively analyzed. Effects of simultaneous oxidation and nitridation duration on...
Main Authors: | Wong, Yew Hoong, Cheong, K.Y. |
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Format: | Article |
Published: |
Electrochemical Society
2011
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Subjects: |
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