Physical and dispersive optical characteristics of ZrON/Si thin-film system
To date, the complex evaluation of physical and dispersive optical characteristics of the ZrON/Si film system has yet been reported. Hence, ZrON thin films have been formed on Si(100) substrates through oxidation/nitridation of sputtered metallic Zr in N2O environment at 500, 700, and 900 ∘C. Physic...
Main Authors: | Wong, Yew Hoong, Atuchin, V.V., Kruchinin, V.N., Cheong, K.Y. |
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Format: | Article |
Published: |
Springer
2014
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Subjects: |
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