Micro-PIXE analysis of doped SiO2 fibres intended as TL dosimeters for radiation measurements
Sample elemental concentrations can be determined using the microbeam proton-induced X-ray emission (PIXE) technique, providing non-destructive simultaneous low-background multi-element analysis. Present interest concerns analysis of Ge-doped SiO2 fibres intended as high spatial-resolution thermolum...
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| Format: | Article |
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John Wiley & Sons
2015
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