Micro-PIXE analysis of doped SiO2 fibres intended as TL dosimeters for radiation measurements

Micro-PIXE analysis of doped SiO2 fibres intended as TL dosimeters for radiation measurements

Sample elemental concentrations can be determined using the microbeam proton-induced X-ray emission (PIXE) technique, providing non-destructive simultaneous low-background multi-element analysis. Present interest concerns analysis of Ge-doped SiO2 fibres intended as high spatial-resolution thermolum...

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Bibliographic Details
Main Authors:	Abdul Sani, S.F., Grime, G.W., Palitsin, V., Mahdiraji, G.A., Abdul Rashid, H.A., Maah, M.J., Bradley, D.A.
Format:	Article
Published:	John Wiley & Sons 2015
Subjects:	T Technology (General) TK Electrical engineering. Electronics Nuclear engineering

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