Development of insulated cu wire stitch bonding

The market demands for higher pin counts and more chips functionality poses challenges in conventional wire bonding. However, the novel insulated Cu wire technology enables fine and ultra fine pitch wire bonding as the insulator coating on the bare wire prevents wires shorting problem. This paper...

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Main Authors: Leong, H.Y., Yap, B.K., Navas, K., Mohd Rusli, I., Tan, L.C., Faiz, M.
Format: Conference or Workshop Item
Language:English
Published: 2013
Subjects:
Online Access:http://eprints.um.edu.my/15601/1/0001.pdf
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author Leong, H.Y.
Yap, B.K.
Navas, K.
Mohd Rusli, I.
Tan, L.C.
Faiz, M.
author_facet Leong, H.Y.
Yap, B.K.
Navas, K.
Mohd Rusli, I.
Tan, L.C.
Faiz, M.
author_sort Leong, H.Y.
collection UM
description The market demands for higher pin counts and more chips functionality poses challenges in conventional wire bonding. However, the novel insulated Cu wire technology enables fine and ultra fine pitch wire bonding as the insulator coating on the bare wire prevents wires shorting problem. This paper present study on the stitch bonding process optimization and its challenges for the insulated Cu wire with the diameter of 20 urn. Insulated Cu stitch bond samples showed 37 % lowe: stitc~ pull s~rength than that of bare Cu. The crosssectioned insulated Cu stitch bond shows that there are insulation residue between the Cu stitch and the Au plated substrate, potentially resulting low.er stitch pull p~rformance. H~wever, after isothermal aging at 225 DC up to 78 hours, the stitch pull results for Insulated Cu WIfe passed the Industry reliability standard, without any lifted bond. A detailed comparison study was performed for the Insulated Cu and the bare Cu stitch bonding.
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spelling um.eprints-156012016-02-22T04:13:52Z http://eprints.um.edu.my/15601/ Development of insulated cu wire stitch bonding Leong, H.Y. Yap, B.K. Navas, K. Mohd Rusli, I. Tan, L.C. Faiz, M. T Technology (General) TA Engineering (General). Civil engineering (General) The market demands for higher pin counts and more chips functionality poses challenges in conventional wire bonding. However, the novel insulated Cu wire technology enables fine and ultra fine pitch wire bonding as the insulator coating on the bare wire prevents wires shorting problem. This paper present study on the stitch bonding process optimization and its challenges for the insulated Cu wire with the diameter of 20 urn. Insulated Cu stitch bond samples showed 37 % lowe: stitc~ pull s~rength than that of bare Cu. The crosssectioned insulated Cu stitch bond shows that there are insulation residue between the Cu stitch and the Au plated substrate, potentially resulting low.er stitch pull p~rformance. H~wever, after isothermal aging at 225 DC up to 78 hours, the stitch pull results for Insulated Cu WIfe passed the Industry reliability standard, without any lifted bond. A detailed comparison study was performed for the Insulated Cu and the bare Cu stitch bonding. 2013-11 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.um.edu.my/15601/1/0001.pdf Leong, H.Y. and Yap, B.K. and Navas, K. and Mohd Rusli, I. and Tan, L.C. and Faiz, M. (2013) Development of insulated cu wire stitch bonding. In: 1st International Conference on the Science & Engineering Materials , Sunway Putra Hotel, Kuala lumpur, Malaysia.
spellingShingle T Technology (General)
TA Engineering (General). Civil engineering (General)
Leong, H.Y.
Yap, B.K.
Navas, K.
Mohd Rusli, I.
Tan, L.C.
Faiz, M.
Development of insulated cu wire stitch bonding
title Development of insulated cu wire stitch bonding
title_full Development of insulated cu wire stitch bonding
title_fullStr Development of insulated cu wire stitch bonding
title_full_unstemmed Development of insulated cu wire stitch bonding
title_short Development of insulated cu wire stitch bonding
title_sort development of insulated cu wire stitch bonding
topic T Technology (General)
TA Engineering (General). Civil engineering (General)
url http://eprints.um.edu.my/15601/1/0001.pdf
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