HCI degradation effect on VDMOS transistor with geometric and process variations

In high power systems, the application of transistor has significantly increased and this includes the important of VDMOS type of transistor. However, reliability issues have always been addressed in high voltage and current operated applications. In order to counter this issues, various studies and...

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Main Authors: Yusof, H.H.M., Soin, N., Murti, W.B.
格式: 文件
出版: Research India Publications 2015
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