Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films
Purpose: This paper aims to determine the crystallite size and microstrain values of AgSiN thin films using potential approach called approximation method. This method can be used as a replacement for other determination methods such as Williamson-Hall (W-H) plot and Warren-Averbach analysis. Design...
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| Format: | Article |
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Emerald
2019
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