Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation

ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric...

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Detalhes bibliográficos
Principais autores: Abo-Hassan, Khedr M.M., Muhamad, Muhamad Rasat, Radhakrishna, S.
Formato: Artigo
Publicado em: Elsevier 2005
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