Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric...
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Elsevier
2005
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