Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Published: |
Elsevier
2005
|
| Subjects: |
| _version_ | 1825722253118013440 |
|---|---|
| author | Abo-Hassan, Khedr M.M. Muhamad, Muhamad Rasat Radhakrishna, S. |
| author_facet | Abo-Hassan, Khedr M.M. Muhamad, Muhamad Rasat Radhakrishna, S. |
| author_sort | Abo-Hassan, Khedr M.M. |
| collection | UM |
| description | ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric and that excess of S was formed as grain boundaries. The XRD profiles showed that the films are polycrystalline with cubic structure grown preferentially along the 〈1 1 1〉 axis. The lattice parameter of the cubic structure varied linearly with the film composition according to Vegard's Law. Most of the samples experienced tensile stress while some of them exhibited compressive stress. © 2005 Elsevier B.V. All rights reserved. |
| first_indexed | 2024-03-06T06:02:50Z |
| format | Article |
| id | um.eprints-24460 |
| institution | Universiti Malaya |
| last_indexed | 2024-03-06T06:02:50Z |
| publishDate | 2005 |
| publisher | Elsevier |
| record_format | dspace |
| spelling | um.eprints-244602020-05-29T01:49:10Z http://eprints.um.edu.my/24460/ Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation Abo-Hassan, Khedr M.M. Muhamad, Muhamad Rasat Radhakrishna, S. Q Science (General) QC Physics ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric and that excess of S was formed as grain boundaries. The XRD profiles showed that the films are polycrystalline with cubic structure grown preferentially along the 〈1 1 1〉 axis. The lattice parameter of the cubic structure varied linearly with the film composition according to Vegard's Law. Most of the samples experienced tensile stress while some of them exhibited compressive stress. © 2005 Elsevier B.V. All rights reserved. Elsevier 2005 Article PeerReviewed Abo-Hassan, Khedr M.M. and Muhamad, Muhamad Rasat and Radhakrishna, S. (2005) Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation. Physica B: Condensed Matter, 358 (1-4). pp. 256-264. ISSN 0921-4526, DOI https://doi.org/10.1016/j.physb.2005.01.422 <https://doi.org/10.1016/j.physb.2005.01.422>. https://doi.org/10.1016/j.physb.2005.01.422 doi:10.1016/j.physb.2005.01.422 |
| spellingShingle | Q Science (General) QC Physics Abo-Hassan, Khedr M.M. Muhamad, Muhamad Rasat Radhakrishna, S. Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation |
| title | Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation |
| title_full | Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation |
| title_fullStr | Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation |
| title_full_unstemmed | Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation |
| title_short | Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation |
| title_sort | some structural parameters of znsxse1 x thin films prepared by electron beam evaporation |
| topic | Q Science (General) QC Physics |
| work_keys_str_mv | AT abohassankhedrmm somestructuralparametersofznsxse1xthinfilmspreparedbyelectronbeamevaporation AT muhamadmuhamadrasat somestructuralparametersofznsxse1xthinfilmspreparedbyelectronbeamevaporation AT radhakrishnas somestructuralparametersofznsxse1xthinfilmspreparedbyelectronbeamevaporation |