Optical constants and electronic transition in hydrogenated silicon (Si: H) hin films deposited by Layer-by-Layer (LBL) deposition technique

Optical constants derived from optical transmission (T) and reflectance (R) spectra in the wavelength range of 220 to 2200 nm are presented in this paper for hydrogenated silicon (Si: H) thin films deposited by plasma enhanced chemical vapor deposition (PECVD) using the layer-by-layer (LBL) depositi...

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Bibliografske podrobnosti
Main Authors: Tong, G.B., Muhamad, M.R., Rahman, Saadah Abdul
Format: Article
Izdano: Penerbit Universiti Kebangsaan Malaysia 2011
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