Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
In this work, we have studied the structural and electrical behavior of Si-incorporated carbon nanostructures (Si-CNS) by performing current-voltage (I-V) measurements using in situ transmission electron microscopy (TEM). The I-V measurement and TEM observation of the corresponding Si-CNS structural...
| Main Authors: | , , , , , , , |
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| Format: | Article |
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Elsevier
2022
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