Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy

Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy

In this work, we have studied the structural and electrical behavior of Si-incorporated carbon nanostructures (Si-CNS) by performing current-voltage (I-V) measurements using in situ transmission electron microscopy (TEM). The I-V measurement and TEM observation of the corresponding Si-CNS structural...

Bibliografiset tiedot
Päätekijät:	Yaakob, Yazid, Lin, Wei Ming, Rosmi, Mohamad Saufi, Mohd Yusop, Mohd Zamri, Sharma, Subash, Chan, Kar Fei, Asaka, Toru, Tanemura, Masaki
Aineistotyyppi:	Artikkeli
Julkaistu:	Elsevier 2022

Samankaltaisia teoksia

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