A fault syndromes simulator for random access memories

Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algo...

وصف كامل

التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Wan Hasan, Wan Zuha, Abdul Halim, Izhal, Mohd Sidek, Roslina, Othman, Masuri
التنسيق: مقال
اللغة:English
English
منشور في: EuroJournals 2008
الوصول للمادة أونلاين:http://psasir.upm.edu.my/id/eprint/12689/1/A%20fault%20syndromes%20simulator%20for%20random%20access%20memories.pdf