Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
This paper reports the structural and electrical conductivity characterization of the copper selenide (CuSe) metal chalcogenide semiconductor in bulk form. In situ X-ray powder diffraction analysis of CuSe at low temperature (100 – 300 K) is studied to support the electrical conductivity analysis....
Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Malaysian Solid State Science and Technology Society
2008
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Online Access: | http://psasir.upm.edu.my/id/eprint/16865/1/Structural%20and%20electrical%20conductivity%20studies%20of%20polycrystalline%20copper%20selenide%20at%20low%20temperature.pdf |