Design of a testchip for low cost IC testing.
With the continuous increase of the integration densities and complexities, the problem of testing integrated circuits has become much more acute and needs an economic solution with reliable performance. This paper presents the design of a TESTCHIP implementing a multiple polynomial, multiple seed b...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English English |
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Taylor & Francis
2009
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| Online Access: | http://psasir.upm.edu.my/id/eprint/17691/1/Design%20of%20a%20testchip%20for%20low%20cost%20IC%20testing.pdf |
| _version_ | 1825946059972542464 |
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| author | Ali, Liakot Sidek, Roslina Aris, Ishak Mohd Ali, Mohd Alauddin |
| author_facet | Ali, Liakot Sidek, Roslina Aris, Ishak Mohd Ali, Mohd Alauddin |
| author_sort | Ali, Liakot |
| collection | UPM |
| description | With the continuous increase of the integration densities and complexities, the problem of testing integrated circuits has become much more acute and needs an economic solution with reliable performance. This paper presents the design of a TESTCHIP implementing a multiple polynomial, multiple seed based mixed-mode test technique. Fault simulation experiments on benchmark circuits show that the TESTCHIP is capable of detecting 100% of the faults using a much lower number of test vectors than in the approaches attempted by the other researchers. It also offers lower data storage requirements than that of conventional ATE. The TESTCHIP is capable of testing combinational circuits as well as sequential circuits with scan-path facilities.
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| first_indexed | 2024-03-06T07:41:11Z |
| format | Article |
| id | upm.eprints-17691 |
| institution | Universiti Putra Malaysia |
| language | English English |
| last_indexed | 2024-03-06T07:41:11Z |
| publishDate | 2009 |
| publisher | Taylor & Francis |
| record_format | dspace |
| spelling | upm.eprints-176912015-11-23T01:56:40Z http://psasir.upm.edu.my/id/eprint/17691/ Design of a testchip for low cost IC testing. Ali, Liakot Sidek, Roslina Aris, Ishak Mohd Ali, Mohd Alauddin With the continuous increase of the integration densities and complexities, the problem of testing integrated circuits has become much more acute and needs an economic solution with reliable performance. This paper presents the design of a TESTCHIP implementing a multiple polynomial, multiple seed based mixed-mode test technique. Fault simulation experiments on benchmark circuits show that the TESTCHIP is capable of detecting 100% of the faults using a much lower number of test vectors than in the approaches attempted by the other researchers. It also offers lower data storage requirements than that of conventional ATE. The TESTCHIP is capable of testing combinational circuits as well as sequential circuits with scan-path facilities. Taylor & Francis 2009 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/17691/1/Design%20of%20a%20testchip%20for%20low%20cost%20IC%20testing.pdf Ali, Liakot and Sidek, Roslina and Aris, Ishak and Mohd Ali, Mohd Alauddin (2009) Design of a testchip for low cost IC testing. Intelligent Automation and Soft Computing, 15 (1). pp. 63-72. ISSN 1079-8587 10.1080/10798587.2009.10643016 English |
| spellingShingle | Ali, Liakot Sidek, Roslina Aris, Ishak Mohd Ali, Mohd Alauddin Design of a testchip for low cost IC testing. |
| title | Design of a testchip for low cost IC testing. |
| title_full | Design of a testchip for low cost IC testing. |
| title_fullStr | Design of a testchip for low cost IC testing. |
| title_full_unstemmed | Design of a testchip for low cost IC testing. |
| title_short | Design of a testchip for low cost IC testing. |
| title_sort | design of a testchip for low cost ic testing |
| url | http://psasir.upm.edu.my/id/eprint/17691/1/Design%20of%20a%20testchip%20for%20low%20cost%20IC%20testing.pdf |
| work_keys_str_mv | AT aliliakot designofatestchipforlowcostictesting AT sidekroslina designofatestchipforlowcostictesting AT arisishak designofatestchipforlowcostictesting AT mohdalimohdalauddin designofatestchipforlowcostictesting |