Characterization of semiconductor nanowires using optical tweezers
We report on the optical trapping characteristics of InP nanowires with dimensions of 30 (±6) nm in diameter and 2 - 15 μm in length. We describe a method for calibrating the absolute position of individual nanowires relative to the trapping center using synchronous high-speed position sensing and a...
| Autori principali: | , , , , , , |
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| Natura: | Articolo |
| Lingua: | English |
| Pubblicazione: |
American Chemical Society
2011
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| Accesso online: | http://psasir.upm.edu.my/id/eprint/24834/1/Characterization%20of%20semiconductor%20nanowires%20using%20optical%20tweezers.pdf |