Morphological characterization of Cus thin films by atomic force microscopy.
The aim of the study was to investigate the influence of solution concentration on the morphological properties of chemically deposited copper sulphide thin films. Atomic force microscopy studies of CuS thin films grown on microscope glass slides at different solution concentrations have been carr...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English English |
| Published: |
Maxwell Science Publication
2011
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| Online Access: | http://psasir.upm.edu.my/id/eprint/24958/1/Morphological%20characterization%20of%20Cus%20thin%20films%20by%20atomic%20force%20microscopy.pdf |