12N test procedure for NPSF testing and diagnosis for SRAMs
Testing and diagnosis techniques play a key role in the advance of semiconductor memory technologies. The challenge of failure detection has attracted investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. March algorithms are widely used in S...
| Main Authors: | , , |
|---|---|
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
IEEE
2008
|
| Online Access: | http://psasir.upm.edu.my/id/eprint/37750/1/12N%20test%20procedure%20for%20NPSF%20testing%20and%20diagnosis%20for%20SRAMs.pdf |