Fault detection with optimum March Test Algorithm
Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algori...
| मुख्य लेखकों: | , , , , |
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| स्वरूप: | Conference or Workshop Item |
| प्रकाशित: |
IEEE
2012
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