Development of automated neighborhood pattern sensitive fault syndrome generator for SRAM
With the increasing complexity of memory devices, fault diagnosis is becoming as important as fault detection. Fault diagnosis is to locate and identify type of fault. One of the memory faults is Neighborhood Pattern Sensitive Faults (NPSF) which is one of the faults that are hard to test due to hig...
| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
IEEE
2012
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| Online Access: | http://psasir.upm.edu.my/id/eprint/47621/1/neighborhood%20pattern%20sensitive%20fault.pdf |