Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes
Two-photon excitation techniques used in fabricating lines defects were done on a light emitting diode chip. Simultaneous detection of a quenched wide-gap semiconductor crystal has been observed using single- and two-photon photoluminescence. It was found at the quenched area, single-photon excitati...
| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
IEEE
2010
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| Online Access: | http://psasir.upm.edu.my/id/eprint/47791/1/Two-photon%20photoluminescence%20induced%20defects%20on%20InGaN%20crystal%20and%20light%20emitting%20diodes.pdf |