Development Of Test Platform Of Fpga Interconnect To Capture Marginal Open Defect

This research highlights the development of test platform of FPGA interconnect to capture marginal open defect on Altera® Stratix V devices. The need for at-speed test was due to the increasing number of marginal open defects, resulting from manufacturing process complexity anticipated from continu...

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Bibliographic Details
Main Author: Mohamed Sultan, Fahmy Hafriz
Format: Thesis
Language:English
Published: 2015
Subjects:
Online Access:http://eprints.usm.my/40813/1/FAHMY_HAFRIZ_BIN_MOHAMED_SULTAN_24_pages.pdf