Reduced Galloping Column Algorithm For Memory Testing
Memory testing is significantly important nowadays especially in SOC’s design, due to their rapid growth in the memory density and design complexity in smaller chip area and low power design. Thus, test time in memory testing is a key challenge to accelerate time to market, high yield and low test...
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| Format: | Thesis |
| Language: | English |
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2015
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| Online Access: | http://eprints.usm.my/41214/1/Ngieng_Siew_Ching__24_Pages.pdf |