Investigation Of Boron Spin On Dopant On SOI Wafer
In this research, works were focused on the doping technique of p-type SOI wafers by using thermal diffusion process. The aim of this research was to prepare doped of p-type SOI wafer by SOD with boron dopant. This method is used to provide an impurity source for SOI wafer. The dopant was first sp...
Main Author: | Bahaudin, Aishah Shamimi |
---|---|
Format: | Monograph |
Language: | English |
Published: |
Universiti Sains Malaysia
2022
|
Subjects: | |
Online Access: | http://eprints.usm.my/56433/1/Investigation%20Of%20Boron%20Spin%20On%20Dopant%20On%20Soi%20Wafer_Aishah%20Shamimi%20Bahaudin.pdf |
Similar Items
-
Investigation Of Phosphorus Spin On Dopant On SOI Wafer
by: Tang, Yi Tian
Published: (2022) -
Investigation Of Oxidation Process On SOI Wafer
by: Salleh, Shaharatul A’ini
Published: (2022) -
Investigation Of Metal Organic Deposition Derived
Cerium Oxide Thin Films On Silicon Wafer
by: Jasni, Farah Anis
Published: (2009) -
Hot extrusion followed by a hot ecap consolidation combined technique in the production of Boron Carbide (B4C) reinforced with aluminium chips (AA6061) composite
by: Al-Alimi, Sami, et al.
Published: (2021) -
Mineralogy and geochemistry investigation of Kuantan bauxite
by: Muhamad Alif Hilmi, Mustafa
Published: (2019)