Control chart pattern recognition using small window size for identifying bivariate process mean shifts

There are many traits in the manufacturing technology to assure the quality of products. One of the current practices aims for monitoring the in-process quality of small-lot production using Statistical Process Control (SPC), which requires small samples or small window sizes. In this study, the rec...

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Bibliographic Details
Main Authors: Kasmin, A., Masood, I., Abdul Rahman, N., Abdul Kadir, A. H., Abdol Rahman, M. N.
Format: Article
Language:English
Published: Penerbit UTHM 2021
Subjects:
Online Access:http://eprints.uthm.edu.my/3753/1/J12571_dbdbdc6b98c363f5fad729580c5fe8b7.pdf