Control chart pattern recognition using small window size for identifying bivariate process mean shifts
There are many traits in the manufacturing technology to assure the quality of products. One of the current practices aims for monitoring the in-process quality of small-lot production using Statistical Process Control (SPC), which requires small samples or small window sizes. In this study, the rec...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Penerbit UTHM
2021
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| Subjects: | |
| Online Access: | http://eprints.uthm.edu.my/3753/1/J12571_dbdbdc6b98c363f5fad729580c5fe8b7.pdf |